Analysis on Grain Growth Law of Aluminum Alloy Wire Short Circuit Melted Marks

The short-circuit melted marks of aluminum alloy wires were successively divided into a-e regions along the direction of grain growth by the method of segmented qualitative and quantitative analysis. Based on the principle of grain formation, the grain growth rules of the first and second short-circuit melted marks of aluminum alloy wires were investigated.The results show that the grain growth law of aluminum alloy wires is different between first short circuit and second short circuit in zone b, which can be used as the basis for distinguishing.